QR-koodi

Scaling behavior of InAlN/GaN HEMTs on silicon for RF applications

Abstract Due to the low cost and the scaling capability of Si substrate, InAlN/GaN high-electron-mobility transistors (HEMTs) on silicon substrate have attracted more and more attentions. In this paper, a high-performance 50-nm-gate-length InAlN/GaN HEMT on Si with a high on/off current (I on/I off)...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Peng Cui, Yuping Zeng
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Nature Portfolio 2022-10-01
Sarja:Scientific Reports
Linkit:https://doi.org/10.1038/s41598-022-21092-9
Tagit: Lisää tagi
Ei tageja, Lisää ensimmäinen tagi!