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Growth and characterization of Ge1-xSnx alloys grown on Ge(001) and GaAs(001)
Single crystal Ge1-xSnx alloys were grown on Ge(001) and GaAs(001) substrates using a RF magnetronSputtering. HRXRD and Raman spectroscopy were used to determine the Sn concentration of the alloys,HRXRD also shows that alloys with Sn<0.04 are pseudomorphic. Optical properties of the alloys werean...
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| Vydáno v: | Superficies y vacío |
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| Hlavní autoři: | , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
2004
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| Témata: | |
| On-line přístup: | https://www.redalyc.org/articulo.oa?id=94217403 |
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