Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation
Polycrystalline CdSx,Te1-x thin films, grown on glass substrates by co-evaporation of CdS and CdTe were characterizedthrough spectral transmittance and x-ray diffraction measurements. The film thickness d and the optical constants weredetermined by simple straightforward calculations using the trans...
में बचाया:
| में प्रकाशित: | Superficies y vacío |
|---|---|
| मुख्य लेखकों: | , , |
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
2003
|
| विषय: | |
| ऑनलाइन पहुंच: | https://www.redalyc.org/articulo.oa?id=94216306 |
| टैग: |
कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!
|