Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation
Polycrystalline CdSx,Te1-x thin films, grown on glass substrates by co-evaporation of CdS and CdTe were characterizedthrough spectral transmittance and x-ray diffraction measurements. The film thickness d and the optical constants weredetermined by simple straightforward calculations using the trans...
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| Vydáno v: | Superficies y vacío |
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| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
2003
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| Témata: | |
| On-line přístup: | https://www.redalyc.org/articulo.oa?id=94216306 |
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