QR Kod

Influence of Si(110) misoriented substrates on the microstructure and photoreflectance of GaAs thin films deposited by MBE

We have grown GaAs layers by molecular beam epitaxy on Si(110) substrates with different tilted angles towards the[001] direction. The samples where characterized by atomic force microscopy (AFM), high resolution x-ray diffraction(HRXRD), and photoreflectance spectroscopy (PR). The surface morpholog...

Ful tanımlama

Kaydedildi:
Detaylı Bibliyografya
Yayımlandı:Superficies y vacío
Asıl Yazarlar: M. A. Vidal, J. Luyo Alvarado, M. López López, M. Meléndez Lira
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 2000
Konular:
Online Erişim:https://www.redalyc.org/articulo.oa?id=94201009
Etiketler: Etiketle
Etiket eklenmemiş, İlk siz ekleyin!