Rutherford Backscattering analysis of Bi-based superconducting films
The elemental composition, film thickness and concentration depth profiles of precursor and superconducting (Bi,Pb)-Sr- Ca-Cu-O films were studied by the Rutherford Backscattering Spectrometry (RBS) technique. The precursor films were deposited on MgO single-crystalline substrates from an aerosol at...
Αποθηκεύτηκε σε:
| Εκδόθηκε σε: | Superficies y vacío |
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| Κύριοι συγγραφείς: | , , , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
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| Θέματα: | |
| Διαθέσιμο Online: | https://www.redalyc.org/articulo.oa?id=94200943 |
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