Rutherford Backscattering analysis of Bi-based superconducting films

The elemental composition, film thickness and concentration depth profiles of precursor and superconducting (Bi,Pb)-Sr- Ca-Cu-O films were studied by the Rutherford Backscattering Spectrometry (RBS) technique. The precursor films were deposited on MgO single-crystalline substrates from an aerosol at...

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Bibliografische gegevens
Gepubliceerd in:Superficies y vacío
Hoofdauteurs: R. Vargas, J.C. Cheang Wong, E. Díaz Valdés, A. Morales, M. Jergel
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 1999
Onderwerpen:
Física, Astronomía y Matemáticas
Bi
Superconductors
spray pyrolysis
based thin films
Rutherford Backscattering
Online toegang:https://www.redalyc.org/articulo.oa?id=94200943
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