Applications of the atomic force microscopy to nuclear track methodology
The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of thistechnology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological featuresare very important in th...
Gardado en:
| Publicado en: | Revista Mexicana de Física |
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| Principais autores: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Sociedad Mexicana de Física A.C.
2007
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| Assuntos: | |
| Acceso en liña: | https://www.redalyc.org/articulo.oa?id=57066312 https://www.redalyc.org/journal/570/57066312/ https://www.redalyc.org/journal/570/57066312/html/ https://www.redalyc.org/journal/570/57066312/57066312.epub https://www.redalyc.org/journal/570/57066312/movil |
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