Applications of the atomic force microscopy to nuclear track methodology
The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of thistechnology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological featuresare very important in th...
Gorde:
| Argitaratua izan da: | Revista Mexicana de Física |
|---|---|
| Egile Nagusiak: | , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Sociedad Mexicana de Física A.C.
2007
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| Gaiak: | |
| Sarrera elektronikoa: | https://www.redalyc.org/articulo.oa?id=57066312 https://www.redalyc.org/journal/570/57066312/ https://www.redalyc.org/journal/570/57066312/html/ https://www.redalyc.org/journal/570/57066312/57066312.epub https://www.redalyc.org/journal/570/57066312/movil |
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