Applications of the atomic force microscopy to nuclear track methodology
The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of thistechnology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological featuresare very important in th...
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| Veröffentlicht in: | Revista Mexicana de Física |
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| Hauptverfasser: | , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Sociedad Mexicana de Física A.C.
2007
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| Schlagworte: | |
| Online-Zugang: | https://www.redalyc.org/articulo.oa?id=57066312 https://www.redalyc.org/journal/570/57066312/ https://www.redalyc.org/journal/570/57066312/html/ https://www.redalyc.org/journal/570/57066312/57066312.epub https://www.redalyc.org/journal/570/57066312/movil |
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