Common-source cold-FET used to validate noise figure measurements and on-wafer FET noise parameters
This work proposes the use of a common-source cold-FET with gate forward biased to validate the noise figure measurements and the noise parameters of on-wafer transistors. Since a common-source cold-FET behaves as an attenuator, its noise figure and noise parameters can be determined from S-paramete...
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| Publicat a: | Revista Mexicana de Física |
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| Autors principals: | , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Sociedad Mexicana de Física A.C.
2013
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| Matèries: | |
| Accés en línia: | https://www.redalyc.org/articulo.oa?id=57028306010 |
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