Common-source cold-FET used to validate noise figure measurements and on-wafer FET noise parameters
This work proposes the use of a common-source cold-FET with gate forward biased to validate the noise figure measurements and the noise parameters of on-wafer transistors. Since a common-source cold-FET behaves as an attenuator, its noise figure and noise parameters can be determined from S-paramete...
Gorde:
| Argitaratua izan da: | Revista Mexicana de Física |
|---|---|
| Egile Nagusiak: | , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Sociedad Mexicana de Física A.C.
2013
|
| Gaiak: | |
| Sarrera elektronikoa: | https://www.redalyc.org/articulo.oa?id=57028306010 |
| Etiketak: |
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
|