Nalaganje...
Infrared Analysis of Thin Films: Amorphous, Hydrogenated Carbon on Silicon
The infrared analysis of thin films on a thick substrate is discussed using the example of plasma-deposited, amorphous, hydrogenated carbon layers (a-C:H) on silicon substrates. The framework for the optical analysis of thin films is presented. The main characteristic of thin film optics is the occu...
Shranjeno v:
| izdano v: | Brazilian Journal of Physics |
|---|---|
| Main Authors: | , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
Sociedade Brasileira de Física
2000
|
| Teme: | |
| Online dostop: | https://www.redalyc.org/articulo.oa?id=46413500006 |
| Oznake: |
Označite
Brez oznak, prvi označite!
|