Načítá se...
Infrared Analysis of Thin Films: Amorphous, Hydrogenated Carbon on Silicon
The infrared analysis of thin films on a thick substrate is discussed using the example of plasma-deposited, amorphous, hydrogenated carbon layers (a-C:H) on silicon substrates. The framework for the optical analysis of thin films is presented. The main characteristic of thin film optics is the occu...
Uloženo v:
| Vydáno v: | Brazilian Journal of Physics |
|---|---|
| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Sociedade Brasileira de Física
2000
|
| Témata: | |
| On-line přístup: | https://www.redalyc.org/articulo.oa?id=46413500006 |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!
|