Dissipated energy in tapping mode by the atomic force microscope

Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological proper ties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the m...

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Библиографические подробности
Опубликовано в: :Acta Scientiarum. Technology
Главные авторы: Gerson Anderson de Carvalho Lopes, Henrique Duarte da Fonseca Filho
Формат: Artigo
Язык:Inglês
Опубликовано: Universidade Estadual de Maringá 2015
Предметы:
Ingeniería
tip
nanoscale
Phase contrast
plastic deformations
Online-ссылка:https://www.redalyc.org/articulo.oa?id=303241625012
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