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Dissipated energy in tapping mode by the atomic force microscope
Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological proper ties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the m...
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| Publicado no: | Acta Scientiarum. Technology |
|---|---|
| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Universidade Estadual de Maringá
2015
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| Assuntos: | |
| Acesso em linha: | https://www.redalyc.org/articulo.oa?id=303241625012 |
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