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Superheat of silicon crystals observed by live X-ray topography

In-situ observations of Si crystal growth and melting have been carried out by live X-ray diffraction topography. Superheated solid states beyond the melting point was observed for dislocation-free crystals with melting in their inside. Dislocations were found to impede superheat and to melt the cry...

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Detalhes bibliográficos
Publicado no:Proc Jpn Acad Ser B Phys Biol Sci
Autor principal: Chikawa, Jun-ichi
Formato: Artigo
Idioma:Inglês
Publicado em: The Japan Academy 2004
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8147664/
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