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X-ray topography of subsurface crystal layers
New capabilities of the Berg–Barrett topographic method are demonstrated using a skew-asymmetric X-ray diffraction scheme for investigating structural changes near the surface of semiconductor materials. Specifying the X-ray extinction depth, the details of defects and strains are revealed with high...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | J Appl Crystallogr |
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| Κύριοι συγγραφείς: | , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
International Union of Crystallography
2017
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5458592/ https://ncbi.nlm.nih.gov/pubmed/28656038 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576717007208 |
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