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Motionless Polarizing Structured Illumination Microscopy
In this investigation, we propose a motionless polarizing structured illumination microscopy as an axially sectioning and reflective-type device to measure the 3D surface profiles of specimens. Based on the spatial phase-shifting technique to obtain the visibility of the illumination pattern. Instea...
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| Vydáno v: | Sensors (Basel) |
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| Hlavní autoři: | , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI
2021
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8073734/ https://ncbi.nlm.nih.gov/pubmed/33920615 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s21082837 |
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