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Motionless Polarizing Structured Illumination Microscopy
In this investigation, we propose a motionless polarizing structured illumination microscopy as an axially sectioning and reflective-type device to measure the 3D surface profiles of specimens. Based on the spatial phase-shifting technique to obtain the visibility of the illumination pattern. Instea...
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| Publicado no: | Sensors (Basel) |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2021
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8073734/ https://ncbi.nlm.nih.gov/pubmed/33920615 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s21082837 |
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