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Local structure analysis of amorphous materials by angstrom-beam electron diffraction
The structure analysis of amorphous materials still leaves much room for improvement. Owing to the lack of translational or rotational symmetry of amorphous materials, it is important to develop a different approach from that used for crystals for the structure analysis of amorphous materials. Here,...
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| Udgivet i: | Microscopy (Oxf) |
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| Hovedforfatter: | |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Oxford University Press
2020
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7989058/ https://ncbi.nlm.nih.gov/pubmed/33319903 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfaa075 |
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