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Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction
Analysis of metal-organic framework (MOF) structure by electron microscopy and electron diffraction offers an alternative to growing large single crystals for high-resolution X-ray diffraction. However, many MOFs are electron beam-sensitive, which can make structural analysis using high-resolution e...
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| Izdano u: | Ultramicroscopy |
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| Glavni autori: | , , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
2020
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7492392/ https://ncbi.nlm.nih.gov/pubmed/32570132 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2020.113048 |
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