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Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction

Analysis of metal-organic framework (MOF) structure by electron microscopy and electron diffraction offers an alternative to growing large single crystals for high-resolution X-ray diffraction. However, many MOFs are electron beam-sensitive, which can make structural analysis using high-resolution e...

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Bibliografiske detaljer
Udgivet i:Ultramicroscopy
Main Authors: Banihashemi, Fateme, Bu, Guanhong, Thaker, Amar, Williams, Dewight, Lin, Jerry Y.S., Nannenga, Brent L.
Format: Artigo
Sprog:Inglês
Udgivet: 2020
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7492392/
https://ncbi.nlm.nih.gov/pubmed/32570132
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2020.113048
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