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Scanning transmission helium ion microscopy on carbon nanomembranes
A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection principle is based on a secondary electron conversion holder with an exchangeable aperture strip allowing its acceptance angle to be tuned from 3 to 98 mrad. The contrast mechanism an...
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| Publicado en: | Beilstein J Nanotechnol |
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| Autores principales: | , , , , , |
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
Beilstein-Institut
2021
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7934706/ https://ncbi.nlm.nih.gov/pubmed/33728240 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.12.18 |
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