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Mechanical characterization of carbon nanomembranes from self-assembled monolayers

This paper reports on the mechanical characterization of carbon nanomembranes (CNMs) with a thickness of 1 nm that are fabricated by electron-induced crosslinking of aromatic self-assembled monolayers (SAMs). A novel type of in situ bulge test employing an atomic force microscope (AFM) is utilized t...

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Библиографические подробности
Главные авторы: Zhang, Xianghui, Beyer, André, Gölzhäuser, Armin
Формат: Artigo
Язык:Inglês
Опубликовано: Beilstein-Institut 2011
Предметы:
Online-ссылка:https://ncbi.nlm.nih.gov/pmc/articles/PMC3257509/
https://ncbi.nlm.nih.gov/pubmed/22259767
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.2.92
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