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Chemical Reaction and Ion Bombardment Effects of Plasma Radicals on Optoelectrical Properties of SnO(2) Thin Films via Atomic Layer Deposition

In this study, the effect of radical intensity on the deposition mechanism, optical, and electrical properties of tin oxide (SnO(2)) thin films is investigated. The SnO(2) thin films are prepared by plasma-enhanced atomic layer deposition with different plasma power from 1000 to 3000 W. The experime...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Materials (Basel)
Egile Nagusiak: Huang, Pao-Hsun, Zhang, Zhi-Xuan, Hsu, Chia-Hsun, Wu, Wan-Yu, Huang, Chien-Jung, Lien, Shui-Yang
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: MDPI 2021
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC7867222/
https://ncbi.nlm.nih.gov/pubmed/33540775
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma14030690
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