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In situ transport measurements reveal source of mobility enhancement of MoS(2) and MoTe(2) during dielectric deposition

Layered transition metal dichalcogenides (TMDs) and other two-dimensional (2D) materials are promising candidates for enhancing the capabilities of complementary metal-oxide-semiconductor (CMOS) technology. Field-effect transistors (FETs) made with 2D materials often exhibit mobilities below their t...

Täydet tiedot

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Bibliografiset tiedot
Julkaisussa:ACS Appl Electron Mater
Päätekijät: Shang, Ju Ying, Moody, Michael J., Chen, Jiazhen, Krylyuk, Sergiy, Davydov, Albert V., Marks, Tobin J., Lauhon, Lincoln J.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: 2020
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC7727257/
https://ncbi.nlm.nih.gov/pubmed/33313511
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsaelm.0c00085
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