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Helium ion microscope – secondary ion mass spectrometry for geological materials
The helium ion microscope (HIM) is a focussed ion beam instrument with unprecedented spatial resolution for secondary electron imaging but has traditionally lacked microanalytical capabilities. With the addition of the secondary ion mass spectrometry (SIMS) attachment, the capabilities of the instru...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7537380/ https://ncbi.nlm.nih.gov/pubmed/33083198 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.11.133 |
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