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Calibration of T-shaped atomic force microscope cantilevers using the thermal noise method
The tip—sample interaction force measurements in atomic force microscopy (AFM) provide information about materials’ properties with nanoscale resolution. The T-shaped cantilevers used in Torsional-Harmonic AFM allow measuring the rapidly changing tip–sample interaction forces using the torsional (tw...
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| Publicado no: | Rev Sci Instrum |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
AIP Publishing LLC
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7413748/ https://ncbi.nlm.nih.gov/pubmed/32872926 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/5.0013091 |
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