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An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that wi...

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Bibliografski detalji
Izdano u:Sci Rep
Glavni autori: Li, Rui, Ye, Hongfei, Zhang, Weisheng, Ma, Guojun, Su, Yewang
Format: Artigo
Jezik:Inglês
Izdano: Nature Publishing Group 2015
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC4625185/
https://ncbi.nlm.nih.gov/pubmed/26510769
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep15828
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