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Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals
White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation-free parts of the crystal and do not...
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| Publicat a: | J Appl Crystallogr |
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| Autors principals: | , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7401780/ https://ncbi.nlm.nih.gov/pubmed/32788899 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720005993 |
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