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X-ray Computed Tomography Instrument Performance Evaluation, Part I: Sensitivity to Detector Geometry Errors

X-ray computed tomography (XCT), long used in medical imaging and defect inspection, is now increasingly used for dimensional measurements of geometrical features in engineering components. With widespread use of XCT instruments, there is growing need for the development of standardized test procedu...

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Bibliografische gegevens
Gepubliceerd in:J Res Natl Inst Stand Technol
Hoofdauteurs: Muralikrishnan, Bala, Shilling, Meghan, Phillips, Steve, Ren, Wei, Lee, Vincent, Kim, Felix
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2019
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7339718/
https://ncbi.nlm.nih.gov/pubmed/34877158
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.124.014
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