Načítá se...

X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors

The development of standards for evaluating the performance of X-ray computed tomography (XCT) instruments is ongoing within the American Society of Mechanical Engineers (ASME) and the International Organization for Standardization (ISO) working committees. A key challenge in developing documentary...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:J Res Natl Inst Stand Technol
Hlavní autoři: Muralikrishnan, Bala, Shilling, Meghan, Phillips, Steve, Ren, Wei, Lee, Vincent, Kim, Felix
Médium: Artigo
Jazyk:Inglês
Vydáno: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2019
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC7339642/
https://ncbi.nlm.nih.gov/pubmed/34877154
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.124.015
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!