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X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors
The development of standards for evaluating the performance of X-ray computed tomography (XCT) instruments is ongoing within the American Society of Mechanical Engineers (ASME) and the International Organization for Standardization (ISO) working committees. A key challenge in developing documentary...
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| Vydáno v: | J Res Natl Inst Stand Technol |
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| Hlavní autoři: | , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2019
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7339642/ https://ncbi.nlm.nih.gov/pubmed/34877154 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.124.015 |
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