Citace podle APA

Muralikrishnan, B., Shilling, M., Phillips, S., Ren, W., Lee, V., & Kim, F. (2019). X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors. J Res Natl Inst Stand Technol.

Styl Chicago

Muralikrishnan, Bala, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, a Felix Kim. "X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors." J Res Natl Inst Stand Technol 2019.

Citace podle MLA

Muralikrishnan, Bala, et al. "X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors." J Res Natl Inst Stand Technol 2019.

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