X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors

The development of standards for evaluating the performance of X-ray computed tomography (XCT) instruments is ongoing within the American Society of Mechanical Engineers (ASME) and the International Organization for Standardization (ISO) working committees. A key challenge in developing documentary...

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Bibliografiske detaljer
Udgivet i:J Res Natl Inst Stand Technol
Main Authors: Muralikrishnan, Bala, Shilling, Meghan, Phillips, Steve, Ren, Wei, Lee, Vincent, Kim, Felix
Format: Artigo
Sprog:Inglês
Udgivet: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2019
Fag:
Article
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7339642/
https://ncbi.nlm.nih.gov/pubmed/34877154
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.124.015
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