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Optimizing detector geometry for trace element mapping by X-ray fluorescence
Trace metals play critical roles in a variety of systems, ranging from cells to photovoltaics. X-Ray Fluorescence (XRF) microscopy using X-ray excitation provides one of the highest sensitivities available for imaging the distribution of trace metals at sub-100 nm resolution. With the growing availa...
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| Vydáno v: | Ultramicroscopy |
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| Hlavní autoři: | , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2015
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4793152/ https://ncbi.nlm.nih.gov/pubmed/25600825 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2014.12.014 |
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