Genome-wide mapping and allelic fingerprinting provide insights into the genetics of resistance to wheat stripe rust in India, Kenya and Mexico

Stripe or yellow rust (YR) caused by Puccinia striiformis Westend. f. sp. tritici Erikss. is a persistent biotic-stress threatening global wheat production. To broaden our understanding of the shared genetic basis of YR resistance across multi-site and multi-year evaluations, we performed a large ge...

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Publicado no:Sci Rep
Main Authors: Juliana, Philomin, Singh, Ravi Prakash, Huerta-Espino, Julio, Bhavani, Sridhar, Randhawa, Mandeep S., Kumar, Uttam, Joshi, Arun Kumar, Bhati, Pradeep Kumar, Mir, Hector Eduardo Villasenor, Mishra, Chandra Nath, Singh, Gyanendra Pratap
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2020
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Article
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7331708/
https://ncbi.nlm.nih.gov/pubmed/32616836
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-67874-x
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