Genome-wide mapping and allelic fingerprinting provide insights into the genetics of resistance to wheat stripe rust in India, Kenya and Mexico

Stripe or yellow rust (YR) caused by Puccinia striiformis Westend. f. sp. tritici Erikss. is a persistent biotic-stress threatening global wheat production. To broaden our understanding of the shared genetic basis of YR resistance across multi-site and multi-year evaluations, we performed a large ge...

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Publicat a:Sci Rep
Autors principals: Juliana, Philomin, Singh, Ravi Prakash, Huerta-Espino, Julio, Bhavani, Sridhar, Randhawa, Mandeep S., Kumar, Uttam, Joshi, Arun Kumar, Bhati, Pradeep Kumar, Mir, Hector Eduardo Villasenor, Mishra, Chandra Nath, Singh, Gyanendra Pratap
Format: Artigo
Idioma:Inglês
Publicat: Nature Publishing Group UK 2020
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Article
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC7331708/
https://ncbi.nlm.nih.gov/pubmed/32616836
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-67874-x
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