Genome-wide mapping and allelic fingerprinting provide insights into the genetics of resistance to wheat stripe rust in India, Kenya and Mexico

Stripe or yellow rust (YR) caused by Puccinia striiformis Westend. f. sp. tritici Erikss. is a persistent biotic-stress threatening global wheat production. To broaden our understanding of the shared genetic basis of YR resistance across multi-site and multi-year evaluations, we performed a large ge...

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Veröffentlicht in:Sci Rep
Hauptverfasser: Juliana, Philomin, Singh, Ravi Prakash, Huerta-Espino, Julio, Bhavani, Sridhar, Randhawa, Mandeep S., Kumar, Uttam, Joshi, Arun Kumar, Bhati, Pradeep Kumar, Mir, Hector Eduardo Villasenor, Mishra, Chandra Nath, Singh, Gyanendra Pratap
Format: Artigo
Sprache:Inglês
Veröffentlicht: Nature Publishing Group UK 2020
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Article
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7331708/
https://ncbi.nlm.nih.gov/pubmed/32616836
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-67874-x
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