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Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π
This article presents measurements of the piezoelectric modulus d (11) of a single crystal of lanthanum gallium silicate (LGS, La(3)Ga(5)SiO(14)). The piezoelectric modulus was measured by X-ray diffraction at angles close to backscattering. Experiments in such schemes are very sensitive to relative...
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| Pubblicato in: | J Appl Crystallogr |
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| Autori principali: | , , , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
International Union of Crystallography
2020
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7312137/ https://ncbi.nlm.nih.gov/pubmed/32684888 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720005154 |
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