Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π

This article presents measurements of the piezoelectric modulus d (11) of a single crystal of lanthanum gallium silicate (LGS, La(3)Ga(5)SiO(14)). The piezoelectric modulus was measured by X-ray diffraction at angles close to backscattering. Experiments in such schemes are very sensitive to relative...

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Detalhes bibliográficos
Publicado no:J Appl Crystallogr
Main Authors: Gureva, P. V., Marchenkov, N. V., Artemev, A. N., Artemiev, N. A., Belyaev, A. D., Demkiv, A. A., Shishkov, V. A.
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2020
Assuntos:
Research Papers
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7312137/
https://ncbi.nlm.nih.gov/pubmed/32684888
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720005154
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