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X-ray diffraction using focused-ion-beam-prepared single crystals
High-quality single-crystal X-ray diffraction measurements are a prerequisite for obtaining precise and reliable structure data and electron densities. The single crystal should therefore fulfill several conditions, of which a regular defined shape is of particularly high importance for compounds co...
Gorde:
| Argitaratua izan da: | J Appl Crystallogr |
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| Egile Nagusiak: | , , , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
International Union of Crystallography
2020
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7312134/ https://ncbi.nlm.nih.gov/pubmed/32684876 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720003143 |
| Etiketak: |
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