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A New Approach to Explore the Surface Profile of Clay Soil Using White Light Interferometry

In order to have a better understanding of the real contact area of granular materials, the white light interference method is applied to explore the real surface morphology of clay soils under high stress. Analysis of the surface profile indicates that there exists a support point height z(0) with...

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Bibliografske podrobnosti
izdano v:Sensors (Basel)
Main Authors: Yang, Suchun, Liu, Junwei, Xu, Longfei, Zhang, Mingyi, Jeng, Dong-Sheng
Format: Artigo
Jezik:Inglês
Izdano: MDPI 2020
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC7309148/
https://ncbi.nlm.nih.gov/pubmed/32466355
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s20113009
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