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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

In materials science and engineering it is often necessary to obtain quantitative measurements of surface topography with micrometer lateral resolution. From the measured surface, 3D topographic maps can be subsequently analyzed using a variety of software packages to extract the information that is...

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Autors principals: Baryshev, Sergey V., Erck, Robert A., Moore, Jerry F., Zinovev, Alexander V., Tripa, C. Emil, Veryovkin, Igor V.
Format: Artigo
Idioma:Inglês
Publicat: MyJove Corporation 2013
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC3622107/
https://ncbi.nlm.nih.gov/pubmed/23486006
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3791/50260
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