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Disorder by design: A data-driven approach to amorphous semiconductors without total-energy functionals
X-ray diffraction, Amorphous silicon, Multi-objective optimization, Monte Carlo methods. This paper addresses a difficult inverse problem that involves the reconstruction of a three-dimensional model of tetrahedral amorphous semiconductors via inversion of diffraction data. By posing the material-st...
Enregistré dans:
| Publié dans: | Sci Rep |
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| Auteurs principaux: | , , , |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
Nature Publishing Group UK
2020
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7210951/ https://ncbi.nlm.nih.gov/pubmed/32385360 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-64327-3 |
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