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Quantitative determination of atomic buckling of silicene by atomic force microscopy
The atomic buckling in 2D “Xenes” (such as silicene) fosters a plethora of exotic electronic properties such as a quantum spin Hall effect and could be engineered by external strain. Quantifying the buckling magnitude with subangstrom precision is, however, challenging, since epitaxially grown 2D la...
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| Publicat a: | Proc Natl Acad Sci U S A |
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| Autors principals: | , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
National Academy of Sciences
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6955330/ https://ncbi.nlm.nih.gov/pubmed/31871150 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1913489117 |
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