Atomic Force Microscopy

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...

Täydet tiedot

Bibliografiset tiedot

Yhteisötekijä:	Bellitto, Victor
Aineistotyyppi:	Livro
Kieli:	Inglês
Julkaistu:	IntechOpen 2012
Aiheet:	thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry Electrochemistry & magnetochemistry
Linkit:	https://directory.doabooks.org/handle/20.500.12854/65873
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