Cargando...

Quantitative determination of atomic buckling of silicene by atomic force microscopy

The atomic buckling in 2D “Xenes” (such as silicene) fosters a plethora of exotic electronic properties such as a quantum spin Hall effect and could be engineered by external strain. Quantifying the buckling magnitude with subangstrom precision is, however, challenging, since epitaxially grown 2D la...

Descrición completa

Gardado en:
Detalles Bibliográficos
Publicado en:Proc Natl Acad Sci U S A
Main Authors: Pawlak, Rémy, Drechsel, Carl, D’Astolfo, Philipp, Kisiel, Marcin, Meyer, Ernst, Cerda, Jorge Iribas
Formato: Artigo
Idioma:Inglês
Publicado: National Academy of Sciences 2020
Assuntos:
Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC6955330/
https://ncbi.nlm.nih.gov/pubmed/31871150
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1913489117
Tags: Engadir etiqueta
Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!