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Quantitative determination of atomic buckling of silicene by atomic force microscopy

The atomic buckling in 2D “Xenes” (such as silicene) fosters a plethora of exotic electronic properties such as a quantum spin Hall effect and could be engineered by external strain. Quantifying the buckling magnitude with subangstrom precision is, however, challenging, since epitaxially grown 2D la...

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Veröffentlicht in:Proc Natl Acad Sci U S A
Hauptverfasser: Pawlak, Rémy, Drechsel, Carl, D’Astolfo, Philipp, Kisiel, Marcin, Meyer, Ernst, Cerda, Jorge Iribas
Format: Artigo
Sprache:Inglês
Veröffentlicht: National Academy of Sciences 2020
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6955330/
https://ncbi.nlm.nih.gov/pubmed/31871150
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1913489117
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