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Quantitative determination of atomic buckling of silicene by atomic force microscopy
The atomic buckling in 2D “Xenes” (such as silicene) fosters a plethora of exotic electronic properties such as a quantum spin Hall effect and could be engineered by external strain. Quantifying the buckling magnitude with subangstrom precision is, however, challenging, since epitaxially grown 2D la...
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| Veröffentlicht in: | Proc Natl Acad Sci U S A |
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| Hauptverfasser: | , , , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
National Academy of Sciences
2020
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6955330/ https://ncbi.nlm.nih.gov/pubmed/31871150 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1913489117 |
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