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Contact Resonance Atomic Force Microscopy Using Long, Massive Tips
In this work, we present a new theoretical model for use in contact resonance atomic force microscopy. This model incorporates the effects of a long, massive sensing tip and is especially useful to interpret operation in the so-called trolling mode. The model is based on traditional Euler–Bernoulli...
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| 出版年: | Sensors (Basel) |
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| 主要な著者: | , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI
2019
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6891549/ https://ncbi.nlm.nih.gov/pubmed/31731825 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19224990 |
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