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Subsurface imaging of flexible circuits via contact resonance atomic force microscopy
Subsurface imaging of Au circuit structures embedded in poly(methyl methacrylate) (PMMA) thin films with a cover thickness ranging from 52 to 653 nm was carried out by using contact resonance atomic force microscopy (CR-AFM). The mechanical difference of the embedded metal layer leads to an obvious...
Shranjeno v:
| izdano v: | Beilstein J Nanotechnol |
|---|---|
| Main Authors: | , , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
Beilstein-Institut
2019
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| Teme: | |
| Online dostop: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6693404/ https://ncbi.nlm.nih.gov/pubmed/31467825 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.10.159 |
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